Features :
Square aperture (40 x 40 mm)
100 µm motion on X, Y
Closed loop control
Silicon sensor technology
Less than 10pm noise floor
Applications :
Super Resolution microscopy
Nanolithography
Particle tracking
Confocal microscopy
Atomic Force Microscopy
Bruker AFM upgrade
| Specifications |
|
| |
|
|
| |
LFS2 |
Unit |
| Range of motion |
100 |
µm |
| Resolution |
0,1 |
nm |
| Typical noise floor |
0,01 |
nm |
| Full range repeatability |
0,2 |
nm |
| Linearization (typical) |
0,02% |
|
| Resonant frequency X / Y |
400 / 300 |
Hz |
| Stiffness X / Y |
0,5 / 0,5 |
N/µm |
| Maximum Load* : |
|
|
| - horizontal use |
1 |
kg |
| - vertical use |
0,5 |
kg |
| Sensor |
Silicon HR sensor |
|
| Size W x L x H |
100 x 100 x 30,2 |
mm |
| Material |
Al |
|
| Cable length** |
2 |
m |
| Controller |
Standard |
|
*Higher load on request
**Higher length on request
